Fast, low-cost system for measuring film thickness and optical constants. Everything contained in amazingly small package. The ideal table top tool. Computer control through USB port.
EASY-TO-USE... push button operation with advanced software that takes care of the work for you.
FLEXIBLE... work with your materials - dielectrics, semiconductors, organics...
POWERFUL... proven SE technology gives you both thickness and index without the uncertainty of single-α ellipsometry or spectrophotometry. Measures depolarization and Mueller Matrix as well.
LOW COST... the power of SE at a much lower cost than a high-level research tool.
FAST... 100s of wavelengths simultaneously collected in seconds - immediate results.
Choose a model from a drop down list, a "Project" to save results in, and click "Measure" button. It's that simple!
Advanced Modeling Capabilities: