You will find all articles of edition 14 (November 2011) on the following page.
Cameras |
Cordin ultra high speed camera – up to 1 mio fpsIn August of this year, we installed the world’s first Cordin Ultra High Speed Camera of the 535D series at the University of Lodz in Poland. |
Cryotechnics |
The Cryostation – New options
The new Cryostation by Montana Instruments is an optical closed-cycle helium cryostat. |
Imaging |
High resolution at a distance: Xradia´s unique X-ray tomography systemsMicrostructural evolution observation to determine the effect of conditions on structure over time. |
Interferometry |
ZeGage™ – Robust and affordable 3D optical profiler for precision surface metrology on the production floor
ZeGage™ is the ideal non-contact optical profiler for quantitative measurements of 3D form and roughness on precision machined surfaces. |
Nanotechnology |
Application: Metamaterial structure fabrication using DPN
Metamaterials are artificially engineered structures that have unusual properties that may not be found in naturally occurring materials. |
Optical tweezers – Soon an established technology?The principle of optical tweezers has been known since the works of Arthur Ashkin in 1970, where he was the first to describe the possibility to detain small particles in an optical trap. |
Particle size |
Particle size measurements with high resolution
At the moment, the disc centrifuge technology provides the highest resolving particle size measurement on the market. |
Photovoltaics |
Characterization of polymer solar cells and modules by luminescence imaging
In this application note, we report about the laterally resolved detection of luminescence emitted from the solar cell by using a CCD camera. |
Things to know about solar reference cellsA small but determining component of an IV measurement set up is the reference cell for the calibration of the intensity of a solar simulator. |
Profilometry |
Precision depth measurement of shallow SIMS craters using a Stylus profilometer
SIMS craters deeper than 0.1 mm can be routinely measured using the P-16+ with less than 1% repeatability, represented here by one standard deviation from a mean depth obtained from ten separate measurements. |
Spectroscopy |
SisuROCK
Hyperspectral imaging for mineral exploration. |
AFM-IR: Analysis of organic photovoltaic materials
Organic compounds play an important role in the current discussions on the development of new materials in photovoltaics. |
International Light leading in radiometry and light measurement technologyInternational Light Technology (ILT) has been one of the leading companies in radiometry and light measurement technology for over 40 years. |
Thin films |
Nanotest, a universal platform to characterize the mechanical properties of surfaces and thin films
With the NanoTest Vantage system, Micro Materials Ltd. offers a universal platform for different methods to characterize the mechanical properties of surfaces and thin films. |
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