More and more, our NIR and SWIR cameras are used for the spatial characterization of wafers and solar cells. To analyze the material characteristics, the spectrum of the luminescent radiation of silicon in the NIR is depicted two-dimensionally. The wafers are transparent in the NIR so that errors or defects below the wafers may be non-destructively detected. As a cost-saving measure, silicon blocks may be examined for defects and inclusions in the NIR even before processing.
Left: Luminescence Image of a solar cell, 1450nm long wave pass filter. Right: Luminescence Image of a solar cell, full spectrum.