Atomic Force Microscopy
LOT offer a complementary trial AFM measurement service to confirm whether the samples you have can be successfully measured and analysed by Atomic Force Microscopy.
Please complete the attached sample request form & we’ll get back to you with an answer from our AFM Application Engineer. Please e-mail the form to Heath Young either on 01372 375353 or by e-mail firstname.lastname@example.org
Park Systems is the technology leader of nanoscale measurements and systems for both research and industry. The product line of Park Systems reflects their focused strength in nanometrology applications.
The company’s comprehensive portfolio of products, software, services and expertise is designed and engineered to help customers achieve the metrology performance that meets in the needs and requirements of present and future applications. Since improvements in nanometrology are key to enabling tomorrow’s research, analysis, processing and product manufacturing, the innovative technology and market leadership of Park Systems in the field of nanometrology will remain as the core competence and market driving force of its future business.